module

Complies with the GB31241-2014 GB/T314385-2015GB/T31467.3-20 testing standards, including battery performance testing, environmental adaptability and reliability testing, safety testing, high-temperature performance testing, constant temperature and humidity testing, thermal shock testing, low-voltage testing, and other environmental reliability testing sections.

cell

Complies with the GB31241-2014 GB/T314385-2015GB/T31467.3-20 testing standards, including battery performance testing, environmental adaptability and reliability testing, safety testing, high-temperature performance testing, constant temperature and humidity testing, thermal shock testing, low-voltage testing, and other environmental reliability testing sections.

solar panel

Shell protection, low temperature, high temperature, impact, vibration, humid heat, corrosion resistance, etc., silicon wafer aging test, temperature and humidity storage, component power attenuation test after 1000 hours of humid heat storage at 85 ° C and 85% humidity.

nuclear power

External stresses on nuclear power equipment and electronic components, such as high and low temperatures, thermal shock, wet heat alternation, temperature cycling, etc., such as environmental temperature radiation vibration shock, or other mechanical and chemical stresses, can accelerate the aging of components. High temperature and temperature cycling are also the main reasons for the aging of electronic components and devices.

On site aerial photography