Technical principle:

Electronic Source Technology
By using Schottky field emission or thermal field emission electron guns, metal electrons are released from confinement through a strong electric field, forming a high brightness and high coherence electron beam. Its brightness far exceeds that of traditional thermal emission electron guns, and the beam spot diameter can be less than 1nm, significantly improving imaging resolution.

Electronic optical system
The electron beam is focused and deflected by an electromagnetic lens to form a small probe, which scans the sample surface line by line, generating signals such as secondary electrons and backscattered electrons. These signals are collected and processed by detectors to generate images that reflect the morphology and composition of the sample.

vacuum system
Maintain a high vacuum environment to prevent electron beam scattering and sample contamination, ensuring signal stability. Some models support low vacuum mode, which allows direct observation of water containing or non-conductive samples.

Desktop field emission scanning electron microscopePerformance parameters:

Resolution: The secondary electron image resolution can reach 1.0nm, and some models can still maintain a resolution of 1.4nm at low voltage (1kV), suitable for observing insulating or electron beam sensitive samples.

Magnification factor: up to 1 million times, covering analysis needs from macroscopic morphology to nanostructures.

Acceleration voltage: typically ranging from 0.2-30kV, supporting low voltage imaging to reduce sample damage.

Detector: Equipped with secondary electron detector (SE), backscattered electron detector (BSE), and energy dispersive spectrometer (EDS), it can simultaneously perform morphology observation and elemental analysis.

Sample stand: Supports large-sized samples, and some models are equipped with tilt and rotation functions to achieve multi angle observation.