From the debut of G1 in 2006 to the official release of the seventh generation flagship Phenom P series G7 (Phenom ProX G7, Phenom Pro G7, Phenom Pure G7), 19 years and 7 generations of product iterations, and 80 years of technological accumulation

• Stable and reliable:80 years of technological heritage

• Using CeB6 crystal filament:3000h ultra long service life, with an average of 5 years for filament replacement

• Automation and AI intelligent scanning electron microscope

• Built in shock absorption system, can be directly placed in production workshops, high-rise QC laboratories, etc

• Original factory integrated energy spectrum EDS:From electronic optical settings, image acquisition to energy spectrum analysis and surface distribution, all are completed in the same unified and intuitive interface

• Low voltage imaging function:For non-conductive, poorly conductive, and electron beam sensitive samples, without spraying gold, it still has high-resolution imaging capability

Highlight interpretation

Highlight 1: Average 5-year replacement of filament - new standard for filament life of 3000h

The FeB6 hexaboride cerium filament is used in the FeNa electron microscope, and this unique choice has now achieved a major breakthrough. new generationG7 seriesOne of the highlights is upgrading the lifespan of a single filament to 3000 hours. Do you know what this means behind it? This represents a significant increase in the lifespan of the filament from an average of every 3 years to an average of every 5 years!

This is not simply digital growth, but a qualitative leap brought about by technological innovation! For users, this change has brought many tangible benefits.

This means a significant reduction in long-term usage costs:

• The cost of consumables has been directly reduced by 50%, which is a considerable savings!

• It takes an average of 5 years to replace the filament, reducing maintenance frequency and downtime!

• The equipment runs stably for a longer period of time, greatly improving work efficiency!

In today's industry where "stability" and "efficiency" are becoming increasingly sensitive, 3000 hours is not just a number for users, it is a common dividend of time, cost, and efficiency.

Highlight 2: Low voltage imaging capability - electron beam sensitive samples

The Phenom G7 scanning electron microscope is equipped with a newly upgraded vacuum design and backscatter detector (BSD), which has a higher signal-to-noise ratio (S/N), higher sensitivity at low voltages, and less signal interference. For non-conductive, poorly conductive, and electron beam sensitive samples, without spraying gold, it still has imaging capability.

Pyramid structure of solar cells

• Magnification factor: 10000X

• 2kV， Unprayed gold, backscattered electron image

• You can clearly see the pyramid structure and details

Carbon fiber and silicon carbide

• Magnification factor: 10000X

• 5kV， Unprayed gold, backscattered electron image

• It can be seen that carbon fiber and silicon carbide have high discrimination ability

The newly upgraded backscatter detector (BSD) reduces image acquisition time and enables faster automated workflows.

• 80 yearsInheritance and precipitation of electron microscopy technology

If the release of G7 is an upgrade, it is actually more like a legacy.

• 80 years of technological accumulation

• Product Evolution in 2019

• 7th generation continuous innovation

From Philips to Thermo Fisher Scientific, the Feina electron microscope has undergone nearly 80 years of technological accumulation, from its initial concept and commercialization to continuous technological innovation and breakthroughs, maintaining its position in the field of electron microscopy.

01. Philips Era (1939-1996)

• Origin:In 1939, Le Poole proposed the concept of an electron microscope, and in 1944, he successfully developed a 150kV electron microscope, laying the technical foundation.

• development:In 1949, a commercial electron microscope EM100 was launched. Subsequently, innovative products were continuously introduced, such as entering the SEM market in 1972 and launching the PSEM500.

02. FEI period (1996-2016)

• mergeIn 1997, Philips' electronic optics business merged with FEI to acquire ESEM technology, enhancing its technological strength.

• Innovation:In 2006, the desktop scanning electron microscope Phenom was launched, with a magnification of 10000 times and a 1500h long lifespan CeB filament. In 2013, the third generation product was launched with a resolution of 17nm and a magnification of 100000 times.

03. Thermo Fisher era (2016 present)

• AcquisitionIn 2016, FEI was acquired by Thermo Fisher Scientific, and in 2018 Phenom World was renamed the Thermo Scientific brand.

• Inheritance and Development:Technologically inheriting FEI's innovative achievements, we continue to improve performance. Currently, in addition to the CeB filament series, we also have a desktop field emission electron microscope series and other specialized electron microscopes for specific fields. Our product line is rich, with dozens of models available.

In decades of deep cultivation, we have always adhered to the principle that each generation upgrade is not simply about adding features, but about solving users' real problems, improving reliability, usability, and reducing long-term costs.

5000+users' choices——Proof of product reliability

As of this year, there have been5000+usersWe are currently using a Funa electron microscope. Covering multiple key industries such as materials, chemicals, metallurgy, energy, semiconductors, and biology.

The joint choice of universities, research institutes, and enterprises makes the Feina electron microscope not only a device, but also a working tool for laboratories, a stable partner for enterprise production, and a reliable cornerstone for scientific research achievements. Behind every application scenario, there is a trust in quality.

15 years of stable operationPhenom G1 Story

The Optoelectronics Research Center of The Hong Kong Polytechnic University is a Phenom G1 user, and the equipment has been running stably for 15 years. They say:

The Feina electron microscopy system has a small volume and fast response speed. Usually, after the sample is prepared, observation can be carried out in just over ten seconds. The system is stable, anti-interference, and does not require strict experimental environment requirements. Because our samples are usually at the micrometer level, the resolution of G1 meets the requirements and provides great help for our daily research. ”

——Professor Cui Jingxian from the Optoelectronics Research Center

15 years of continuous stable operation, a device spanning several generations of researchers, witnessed the birth and publication of top tier papers, from G1 to G7, time is both a test and a good reputation. Equipment may age, but reliability does not age!

14348+high-quality articles——Small size can also support big science

A consensus is emerging among scientific research users: "The Feina desktop electron microscope, with its small body, can also publish major achievements

Up to now, research conducted using the Feina electron microscope has been published in over 14348 academic papers both domestically and internationally, covering fields such as materials, energy, environment, life sciences, chemical engineering, metallurgy, and nanotechnology. Published in high impact journals such as Nature, Science, Advanced Materials, Nano Letters, JMCA, AFM, Small, etc.

The reason why Feina electron microscopy can become the "data carrier" for high-quality papers comes from three underlying advantages:

01. Stable and reproducible imaging quality

Scientific research requires "verifiability and reproducibility" the most, and the stability of the Feina electron microscope makes the image data reliable and trustworthy.

02. Convenient to use, you can capture publishable level images at any time

From sample preparation to imaging, it only takes a few minutes. Small and compact in size, without the need for large venues, allowing research teams to obtain nanoscale images at any time.

03. High cost-effectiveness, making it possible for more experiments to be repeatedly verified

Consumables have low cost, long maintenance cycle, and are available 24/7, making them suitable for batch experiments, comparative studies, and long-term tracking in scientific research.

Many master's and doctoral students in research groups with Feina electron microscopy have provided feedback:

When other research groups needed to queue for two weeks to get on the computer, we had already completed the reshoot of the third map and sent it to our supervisor for confirmation

Being able to consistently produce high-level papers essentially demonstrates that Feina is not just a device, but also a productive force in scientific research.

8 Honors Witness——Not only technology

Over the years, we have continuously gained recognition from the industry: multiple industry innovation awards, important technological breakthrough awards, and multiple user selection awards through international certification for consecutive years.

• 2015- Today's Microscopy Innovation Award

• 2009- German Design Award

• 2008- GIO Industrial Design Award

• 2008- Innovation Technology Award

• 2008- PTB Annual Zuijia Product

• 2007- Outstanding Innovation Award for Business in the United States

• 2007- Red Dot Design Award

• 2006- Dutch Electromechanical Award

He was awarded the Dutch Mechatronics Prize for his collaborative research and manufacturing capabilities in the field of mechanical electronics.

Every award is a recognition of research and development; Every recognition is a reconfirmation of stability.

Stable device usage——Stable after-sales service, full escort throughout the process

01 Professional team, fast response

• Master's degree team with strong technical capabilities

• One click repair: Quickly connect with after-sales customer service, respond to your needs in a timely manner, and solve any questions or confusion you may encounter during the use of the electron microscope.

02 Preventive maintenance, stable operation

• Regular follow-up monitoring: Remote diagnosis multiple times a year to identify hidden dangers and ensure equipment failure

• Regular calibration: ensure that all parameters of the equipment are normal

03 Multidimensional Empowerment, Supporting Scientific Research

• Annual 15+training sessions: online and offline practical guidance, covering everything from installation to advanced applications

• Expert on-site guidance and customized training on application domain knowledge to meet the differentiated needs of universities, enterprises, and research institutions

• Exclusive knowledge base: software upgrades, one click access to industry cases, unlocking device potential

G7 is not just about upgrading——It's more of an innovation

We always believe that true innovation is not about stacking parameters, but about verifying reliability over time. The launch of G7 is not just about improving performance, but also about making every detail that customers care about better:

• Doubling the lifespan of the filament and reducing maintenance by 50%

• Higher system stability

• Better imaging performance

• A smarter human-machine experience

• Lower comprehensive usage cost

With the continuous advancement of technology, Feina Electron Microscopy will continue to be committed to technological innovation, providing users with more stable, efficient, and intelligent electron microscopy products, and helping scientific research and production reach new heights. In the context of the rapid development of new generation materials, energy, batteries, and biology, we hope that G7 can become a "stabilizing force" for every laboratory and production line.

Phenom P series G7 electron microscope

Phenom ProX G7 Electron Microscope Energy Spectrometer Integrated Machine

Phenom Pro G7 High Resolution Professional Edition Desktop Scanning Electron Microscope

Phenom Pure G7 High Cost Performance Standard Edition Desktop Scanning Electron Microscope