The Feina electron microscope is equipped with a secondary electron imaging mode for customers, taking the observation of the three-dimensional appearance of samples to a new level. The Feina electron microscope has two "eyes" for observing samples - a backscatter detector (BSD) and a secondary electron detector (SED). No matter what observation needs you have, these two "eyes" can meet the vast majority of your requirements.

Secondary electronic mode

The Feina desktop scanning electron microscope can be equipped with a secondary electron probe inside to collect the secondary electrons ejected from the sample. These secondary electrons mainly come from the surface 1~10nm away from the sample. Due to the small incident depth, the action area of the incident electrons is not significantly different from the beam spot size of the incident beam. Therefore, under the same conditions, the resolution of secondary electrons is better than that of backscattered images. Moreover, due to the sensitivity of secondary electrons to the tilt angle of the sample, the secondary electron image can present a better three-dimensional morphology, as shown in the following figure.