High and low temperature thermal shock test chamberIt is a reliability testing equipment used to simulate rapidly changing temperature environments in extreme environments. It is mainly used to evaluate the durability, stability, and failure modes of electronic components, integrated circuits, automotive parts, aerospace materials, military products, and consumer electronic products under severe temperature fluctuations. Its core function is to switch the sample from a high temperature zone (such as+150 ℃) to a low temperature zone (such as -65 ℃ or lower) in a very short period of time (usually a few seconds to tens of seconds), repeatedly cycling to accelerate the exposure of potential defects such as microcracks, solder joint fatigue, coating peeling, etc. caused by thermal expansion and contraction of the material.

　　High and low temperature thermal shock test chamberUsage method:

1、 Preprocessing

Place the test sample under normal atmospheric conditions (such as room temperature) until the sample temperature stabilizes (usually requiring several hours of standing). This step ensures that the initial state of the sample is consistent and avoids affecting the test results due to temperature differences.

2、 Initial detection

Sample inspection: Compare the sample with standard requirements (such as size, appearance, performance parameters) to ensure compliance with test conditions.

Placement of samples: Place the samples into the sample rack or basket inside the test chamber according to standard requirements, ensuring that there is no direct contact between the samples and the box wall or sample rack, and avoiding uneven temperature conduction.

3、 Experimental execution

The experiment usually includes three stages: high temperature impact, low temperature impact, and cyclic impact. The specific steps are as follows:

High temperature stage

Set parameters: Raise the temperature of the test chamber to the preset high temperature value (such as+70 ℃) and maintain it for 1 hour or until the sample temperature stabilizes (whichever is longer).

Observation record: Record the temperature change curve and sample status (such as deformation and cracking).

Low temperature stage

Quick conversion: After the high temperature stage is completed, transfer the sample to the test chamber that has been adjusted to the preset low temperature value (such as -55 ℃) within 5 minutes.

Holding time: Hold for 1 hour or until the sample temperature stabilizes.

Observation record: Check whether the sample has brittleness, shrinkage, or abnormal electrical performance.

Cyclic impact

Repeat the process: Repeat the above steps in the order of "high temperature → low temperature → high temperature" to complete 3 complete cycle cycles (some standards may require more cycles).

Error adjustment: Depending on the sample size and test chamber space, slight errors (such as ± 5 minutes) are allowed in the allowed time.

4、 Restore

After the experiment is completed, remove the sample from the test chamber and place it under normal atmospheric conditions (such as room temperature) until the sample temperature returns to its initial state. This step is used to observe the performance recovery of the sample after leaving the polar environment.

5、 Post detection

Performance evaluation: Test the appearance (such as cracks and discoloration), size changes, weight loss, and electrical performance (such as resistance and insulation) of the sample in accordance with standard requirements.

Result judgment: Evaluate whether the sample is qualified based on the degree of damage (such as the number of cracks, performance degradation rate).