This company is an institution that integrates research and development, design, manufacturing, application, and sales of third-generation semiconductor doping technology for silicon carbide (SiC) in China. We are an explorer dedicated to the structural design and epitaxial growth of high-power semiconductor chips, the design and application of MOSFET and IGBT chips, and the packaging and heat dissipation of third-generation semiconductor power devices.

Thetametrisis is a high-tech company independently developed from the Greek National Center for Scientific Research and Development. Its main technology is to use optical reflectance spectroscopy analysis to accurately measure the thickness and refractive index of single and multiple layers, with a thickness measurement range from a few nanometers to micrometers.

FR Scanner (370nm-1020nm) is a desktop measuring instrument with a small footprint, suitable for automatically measuring the thickness of coatings set at different positions on wafers. FR Scanner can quickly and accurately measure the characteristics of thin films, such as thickness, refractive index, etc. The wafer stage with vacuum adsorption can test products of different sizes and shapes.

FR Scanner scans the entire wafer by rotating it and linearly moving it at high speed and precision (radius and angle). Through this method, it can record precise reflectivity data with high repeatability, making FR Scanner an ideal tool for at line and online mapping of coatings on wafers or other substrates.

FR Scanner offers a wide range of application configurations, with thin films as thin as a few nanometers and thick as hundreds of micrometers, and is equipped with dedicated software for daily use. FR Scanner provides excellent performance in terms of accuracy, precision, reproducibility, and long-term stability.