The customer is an instrument and equipment company located in Nanshan High tech Park, Shenzhen. The core team is from the Chinese Academy of Sciences and is committed to providing agile+lean preparation, measurement and control instruments in the field of material surface treatment and vacuum film. The customer intends to use the purchased FR-ES film thickness measuring instrument for secondary development to expand its application range.
The FR-ES film thickness measuring instrument adopts visible light interferometry measurement in the wavelength range of 370-1020nm, which can measure the film thickness in the range of 12nm-100um, with an accuracy of up to 0.1% or 1nm and an accuracy of 0.05nm. It is a cost-effective film thickness measuring device.