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E-mail
marketing@dymek.com
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Phone
13917837832
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Address
Room 306-308, Building 6, No. 35, Lane 2216, Jingao Road, Pudong, Shanghai
About Us
Daimei Instrument Technology Service (Shanghai) Co., Ltd
Date: 2024-01-08Read: 0
The client is a Chinese Academy of Sciences unit located in northeastern China, with a focus on advanced materials research. In the field of advanced materials, there are six main research directions: advanced material design, advanced structural materials, advanced composite materials, advanced functional materials and devices, advanced energy materials and devices, and electrical analysis instruments; This unit has multiple national key laboratories; It is one of the units authorized by the Academic Degrees Committee of the State Council to cultivate masters, doctors and establish post doctoral mobile stations, and is the key training base for doctoral students of the Chinese Academy of Sciences.
The FR-ES film thickness measuring instrument adopts visible light interferometry measurement in the wavelength range of 370-1020nm, which can measure the film thickness in the range of 12nm-100um, with an accuracy of up to 0.1% or 1nm and an accuracy of 0.05nm. It is a cost-effective film thickness measuring device.
Accessories include:
optical filter--Applicable photoresist
FR-Mic--Used for micrometer level area measurement
hand/Automatic loading platform--100x100mmor200x200mm
film/cup holder--Used for absorption rate/Transmittance and chemical concentration measurement
integrating sphere--Used for diffuse and total reflection
API--Secondary software development
Contact probe--ST is an attachment used for measuring the reflectivity film thickness of bent samples
By combining different modules, the final setting can meet any user's needs.