In situ imaging deviceMain types and application scenarios:

In situ CT imaging characterization system

Technical Specifications:

Sealed transmission X-ray tube, tube voltage 20-190 kV, maximum output power 50 W.

Resolution ≥ 0.7 μ m, sample turntable load capacity of 15 kg.

One set of high-precision flat panel detector with 2048 × 2048 pixels.

Application Scenario:

Fields such as lithium batteries, semiconductor chips, oil and gas geology, archaeology, aerospace, automotive industry, and botany.

By combining imaging techniques such as grating and X-ray near edge absorption spectroscopy, micro nano resolution three-dimensional spatial structure and valence state change information of light element materials (C, Li, Si, Al, etc.) samples can be obtained in situ.

Marine Organism In Situ Imager

Technical principle:

By using back view imaging technology and infrared light, high-definition capture of marine organisms is achieved through the combination of imaging cabin and light source cabin.

Technical advantages:

Capable of clearly imaging plankton with sizes ranging from 100 μ m to 50mm.

The imaging method effectively avoids any interference with organisms and ensures their natural state.

Application Scenario:

Marine science research, biological monitoring, environmental protection and other fields.

otherIn situ imaging device

In situ desktop X-ray absorption spectroscopy characterization system:

Software and hardware integration, fully automated data acquisition, can achieve 7 × 24-hour continuous experiments.

Mainly applied in the research of functional material properties and the synthesis of nanomaterials in basic disciplines.

In situ Raman characterization system:

With its advantages of rich information, simple sample preparation, and minimal water interference, it has a wide range of applications in chemistry, materials, physics, and other fields.

Various in-situ characterization techniques such as Raman spectroscopy have been developed to meet research needs.

In situ XRD characterization system:

X-ray diffraction function with second level time resolution, suitable for fields such as functional materials science and nanomaterials.