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E-mail
2822343332@qq.com
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Phone
15810615463
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Address
Mapo Xiangyue Sijisan District, Shunyi District, Beijing
Beijing Jingke Zhichuang Technology Development Co., Ltd
2822343332@qq.com
15810615463
Mapo Xiangyue Sijisan District, Shunyi District, Beijing
Notice of Approval for Equipment Renewal Projects in Universities and Vocational CollegesGDPT-900Atemperature variationpiezoelectricD33testerFerroelectric, dielectric, thermoelectric, and thermal equipmentThe specific information and technology are as follows:
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Product Name
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Technical parameters for bidding |
GDPT-900AVariable temperature piezoelectricd33measurement systemMain introduction |
GDPT-900AVariable temperature piezoelectricd33The measurement system is developed by our institute for low-temperature testingD33Coefficient, and can also be tested at high temperaturesD33Coefficient. Mainly for testing high and low temperature piezoelectric ceramic materials and thin film materials. 2、 Main application areas: non-destructive testing ultrasonic testing, medical ultrasonic testing, aerospace, oil and gas equipment, automotive IoT, industrial
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GDPT-900AVariable temperature piezoelectricd33measurement systemMain technical parameters |
1Thed33Measuring range:1PC/N-6000PC/N(1.5PC-30000PC) 2Force display:0.01-4N 3Power supply: Voltage220V 4Temperature range: Temperature-100℃ to+500℃ 5Temperature control accuracy: Temperature display accuracy0.01℃, temperature control accuracy ±0.1℃, temperature drift better than ±0.1Within ℃, overshoot ≤0.1℃。 6Heating slope:0.00to5.00℃/min, typical value2.00℃/min. 7Interval insulation:0.10to50.00℃/Point, keep warm5It takes only minutes to reach a stable temperature state. 8Sample fixture: holds double-sided electrode samples with a diameter less than30mmThickness less than5mm. 9Measurement environment: low temperature, high temperature, air, etc. 10Electrode material: High temperature resistant electrode. 11Cooling method: liquid nitrogen control system 12Display: LCD display 13Collection method:USB2.0High speed data 14Total weight: 15kg左右。 15Software: Specialized software automatically tests the relationship between temperature and piezoelectric coefficient changes
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GWTF-300High temperature ferroelectric material measurement system |
GWTF-300The high-temperature ferroelectric material measurement system is a ferroelectric measurement system established under high temperature and high pressure, designed to measure materials with special requirements at high temperatures. This system not only achieves high-temperature testing in temperature, but also improves voltage and frequency, which brings more important help to our research and testing of ferroelectric materials. The system can measure the hysteresis loop and saturation polarization of ferroelectric materialsPsRemaining polarizationPrCoercive fieldEcLeakage current, fatigue, holdingI-VTesting of performance such as switch characteristics.
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GWTF-300Technical specifications of high-temperature ferroelectric material measurement system |
1.Output signal voltage:0-4000/5000/6000/10000Multiple customizable options 2.Output signal frequency:0.2to100Hz(Ceramics, single crystals),1to1kHz(Thin film) 3.Capacitor range: current0To ±6mA(Ceramic, single crystal), ±50mA(Thin film) continuously adjustable,precision:≤1%. 4.current range: 1nA~10A ,precision:≤1%. 5Temperature measurement range:0-200℃ 6. Match high-temperature electrical strain testing modules, fixtures, and automatic acquisition software. 7.Test speed: Measurement time《5second/Sample • Temperature Point 8. Sample specification: Block material size: Diameter2-100mm, thickness0.1-10mm, Film: Diameter:1-60mm 9. Data acquisition and analysis software: capable of drawing hysteresis loops of ferroelectric thin films and quantitatively obtaining the saturation polarization of ferroelectric thin film materialsPsRemaining polarizationPrCoercive fieldEcParameters such as leakage current;It can conduct tests on the ferroelectric fatigue performance, ferroelectric retention performance, resistance measurement, and leakage current measurement of ferroelectric thin film materials. 10Control method: Computer real-time control, real-time display, real-time data calculation, analysis and storage 11Software collection: Automatic collection software, analysis can be compatible with other related mainstream software. |
GWJDN-1000Main technical parameters of the wideband high-temperature dielectric measurement system |
GWJDN-1000Broadband High Temperature Dielectric Measurement System Keywords: high temperature dielectric,
GWJDN-1000High temperature dielectric measurement system(2019The high-temperature dielectric measurement system is applied to measure and analyze the conductivity and dielectric properties of materials and devices in high-temperature environments. By configuring different testing equipment, different parameters can be tested. It is a high-temperature dielectric testing system testing device and an important material testing equipment for national research institutes and higher education institutions. 1、 Main purpose: 1Measure the following parameters as a function of temperature(T)Frequency(f)Voltage level(V)Bias voltage(Vi)The pattern of change: 2Measure capacitance(C)Inductance(L)Resistance(R)Reactance(X)Impedance(Z)Phase angle(¢)Conductivity(G)Electricity absorption(B)Admittance(Y)Loss factor(D)Quality factors(Q)Waiting for parameters, 3Simultaneously calculate the complex dielectric constant to obtain the conductivity and dielectric properties of the reaction material(εr)And dielectric loss(D)Parameters. 4Can test the dielectric properties of materials and devices in low-temperature environments 5According to user needs, Curie temperature points can be customized and developedTcMechanical and electrical coupling coefficientKpMechanical quality factorsQmAnd magnetic permeabilityMMeasurement and analysis of parameters. The system integrates low-temperature environment, temperature control, and sample installation; It has the characteristics of small size, simple operation, high temperature control accuracy, etc. 2、 Main technical parameters: Main technical parameters: 1Temperature range: room temperature-1000℃ 2Temperature measurement accuracy: 0.1℃ 3Heating rate: 1—20℃/min 4Temperature control mode: Program control, providing various combination methods such as room temperature, variable temperature, constant temperature, heating, cooling, etc 5Communication interface:RS-485 8Electrode material: Platinum iridium alloy 9Upper electrode: diameter1.6mmBall head electrode, lead with coaxial shielding layer 10Lower electrode: diameter26.8mmFlat electrode, lead with coaxial shielding layer 11Protection electrode: Equipped with protective electrodes to eliminate the influence of parasitic capacitance and boundary capacitance on testing 12Electrode interference shielding:Electrode lead with coaxial shielding, sample platform with shielding cover 13Fixture lifting control: Electric lifting device with program and manual control, replaceable fixture 14Thermocouple The thermocouple probe and sample platform are in the same heat sink, and the measured and controlled temperature is consistent with the sample temperature 15Sample size without electrodes: diameter less than40mmThickness less than8mm 16Sample size with electrode: Diameter less than26mmThickness less than8mm 17Software Function: Automatically analyze data, classify and save, combine samples and measurement plans together, generate experimental plans required by the system, and outputTXTTheXLSTheBMPEqual format file 18Measurement plan: Provide flexible and rich testing settings, including frequency spectrum, impedance spectrum, dielectric spectrum, and their combinations 19Standard polarized samples:8Film(10mm*1.5mm) 20Supporting equipment and devices: capable of cooperatingZJ-3andZJ-6Measurement using a piezoelectric tester 21Supporting equipment and devices: can be configured10MM,20MM,30MM,40MMCompression fixture 23Testing frequency:20HZ-10MHZ 24Test voltage level:100mV—2V 25Resolution:1MHZ 26Output impedance: 100Ω 27Test parameters:Cp/CsTheLp/LsTheRp/RsThe|Z|The|Y|TheRTheXTheGTheB、θ、DTheQTheVacTheIacTheRdcTheVdcTheIdc 28Basic accuracy: 0.05% 29Display:LCD (Liquid Crystal Display) 30Parameter measurement: multifunctional graphics and parameter measurement 31Interface method: RS232CorHANDLER
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HTIM-600CMain technical parameters of high-temperature resistivity tester for type materials
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HTIM-600CHigh temperature resistivity tester for type materials Keywords: resistivity, bulk resistance, surface resistance,CNAS HTIM-600High temperature resistivity tester is a measuring device for materials that can provideCNASA professional material high-temperature measuring equipment with overall certification, which adoptsDiversified usage methods,2000V,6.4msThe collection system has been implemented, which is a previous product300Double anti-interference function6.4msHigh speed measurement is used as a picoammeter for low capacitance inspection,2×10^19Ωdisplay0.1fAResolution standardEXT I/O, RS-232C, GP-IB, USBThe self-designed floating circuit can perform stable measurements without being affected by the measurement environment, and is used in production lines to achieve high-speed measurements. achievableThe standard design and development of resistance and resistivity testing methods for insulation materials at high temperatures can directly measure the resistance and bulk resistivity, leakage current, and other curves of samples under high temperature, vacuum, and atmosphere conditions as a function of temperature and time. The high-temperature insulation material resistivity tester system has been well applied in the field of aerospace sensors. 1、 Main purpose: Suitable for evaluating the characteristics of new materials: 1Insulation degradation test for ceramic components 2Surface mount capacitorsIRmeasurement 3TheMLCCInsulation measurement of multi-layer ceramic capacitors 4Insulation measurement of photovoltaic cell thin films 5Insulation (high resistance) measurement of noise filters 6Insulation measurement of LCD devices 7Measurement of surface resistivity of coatings (paints) 8Measurement of the Chargeability of the Shell 9Measurement of Smiling Leakage Current of Diodes 10Primary of optocoupler/Secondary insulation (high resistance) measurement 11Insulation measurement of printer toner roller shaft 12Used for evaluation testing of insulation seals for semiconductor manufacturers 13Used for assembly in surface mount machines, sorting machines, and automation equipment 1、 Product features: 1Super insulation meter with multiple usage methods,provideCNASMeasurement Certificate of Conformity 2Can serve asIRHigh resistance meters such as meters and electrostatic meters, as well as small current meters such as picoammeters, are widely used measuring instruments with diverse usage methods. 2Capable of stable measurement without being affected by the measurement environment, and applied in the production line to achieve high-speed measurement2000Voutput 3Deviation1/60, noise resistance performance300times,Through a brand newSMThe combination of floating circuit and three-axis connector greatly improves the noise resistance performance. 4Output voltage from0.1Vto1000V, able to0.1VSet arbitrarily for the unit 5The6.4msThe high-speed inspection,High speed inspection and50mAThe combination of pre charging functions can achieve high outputMLCCCheck. 5High temperature furnace, testing fixtures for high temperature resistance and oxidation resistance,provideCNASMeasurement Certificate of Conformity 2、 Main technical parameters: 1Scope of testing for volume resistivity and surface resistivity10of4powerOmega. cm~10of15powerOmega. cm; 2Test voltage:10VThe50VThe100VThe250VThe500VThe1000V 3Electrode material:600℃Non oxidizing, with three electrode sizes of25mm(diameter of protected electrode)38mm(inner diameter of protective electrode)50mm(Outer diameter of protective electrode), sample thickness in3mmWithin; 3Measurement accuracy: ① Resistance ≤1010ΩAccuracy ±5%; resistance>1010ΩAccuracy ±10%② Voltage <100VAccuracy ±5%Voltage ≥100VAccuracy ±2%; 2Temperature range;room temperature~600℃; 3Temperature control accuracy: Temperature ≤300℃, accuracy±1℃Temperature>300℃, accuracy±2℃Temperature control equipment should have temperature measurement ports; (Can be measured through measurement)CNASCertification) 4Testing software: ① Continuous temperature rise testing can be set up to obtain specific values of volume resistivity and surface resistivity at different temperatures, directly obtaining volume resistivity-Temperature curve, surface resistivity-Temperature curve; 5Temperature accuracy: It can be set to test at a specific temperature point to obtain the specific values of volume resistivity and surface resistivity at different time points, directly obtaining the volume resistivity-Time curve, surface resistivity-Time curve; 5Computer requirements:windows10System, Memory16GAboveCPUQuad nucleus; 6Heating rate0℃/min~ 10℃/min(No measurement requirements); 7Can pass nitrogen gas, tested under high temperature and nitrogen environment; 9Compliant withGB/T31838TheGB/T10581TheGB/T1410Standard; 10The exhaust port is equipped with a filtering device;
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HTRT-1000Technical parameters of high-temperature resistivity tester for conductive materials |
HTRT-1000High temperature resistivity tester for conductive materials Keywords: resistivity, conductivity, alloy, high temperature Electrical resistivity characterization technology is a typical method for studying the phase transformation behavior of metals and alloys, such as analyzing carbon motion behavior in advanced steels, studying alloy precipitation kinetics, and characterizing the pre phase transformation behavior of shape memory alloys. The resistivity is very sensitive to these phase transition behaviors, and using resistivity methods to study the kinetics of alloy precipitation is also an important means to monitor the entire aging precipitation process of alloys. Meanwhile, through the evolution law of resistivity, a clear judgment can be madeGPDifferent stages such as zone, precipitation incubation time, precipitation end (large precipitation amount), and maturation process. For all precipitation strengthened alloys, resistivity data can provide important process guidance. In addition, the appearance of nano domains during the pre phase transition process leads to modulus softening and relaxation internal friction behavior, especially in the early stage of phase transition, which is difficult to observe with electron microscopy. However, the appearance of nano domains is manifested as an increase in electrical resistivity. Therefore, the evolution process of temperature and domain area at which nano domains appear can be clearly characterized through the evolution of electrical resistivity. HTRT-1000This system is mainly composed of high-precision and high stability small current sources, high-precisionADA metal resistivity intelligent storage and analysis instrument composed of sampling chips and embedded chips, intelligent management and analysis software for upper computer, and vacuum multi-stage temperature control heating equipment. The heating and cooling curves of the metal sample can be arbitrarily set according to the testing process requirements. Through precise measurement of the resistivity during the process, the analysis of the internal structural changes of the metal, such as phase transformation, carbides, and solid solubility, can be completed. 1. Purpose: 1Measurement of metal conductivity of bars, pipes, and profiles 2Research on Metal Materials 3、Measurement of resistivity and conductivity of carbon based conductive materials 4Measurement of resistivity and conductivity of metal oxide based conductive materials 5Conductivity testing of graphene metal materials 2、 Complete set of equipment composition: 1.Temperature control box: arbitrarily set multiple heating and insulation curves, heating range:Room temperature to1000℃. Temperature control accuracy ±1oC. 2.Vacuum heating furnace tube: quartz vacuum tube is used to achieve a vacuum sealed state, achieving6*10-2Pa. 3.Control signal box: high-precision constant current source200uA-10mA,Continuously adjustable (or customized) through computer communication control, measuring1uOh. 4.Computer: Communication control temperature controller heating curve, real-time reception of current temperature value and storage display. Display resistivity based on temperature values-Temperature curve. Simultaneously store the testing condition information of the procedure and the data of the testing process. Complete basic database management, querying, printing, and other functions. 5. Low temperature device: Low temperature experiments can be extended-150℃, complete high and low temperature experimental functions. 6. appRemote monitoring: mobile phoneappComplete the monitoring of the main parameters of the experimental equipment, and you can understand the current status of the experiment without having to stay next to the furnace. 7.Suitable for scientific research institutions and universities to test the conductivity, microstructure changes, phase transition information, and other properties of metal materials. 3、 Basic technical parameters 1Temperature control range;-150 ℃-1000 ℃Accuracy:-150 ℃-1000 ℃Accuracy ±1 ℃ 2Measurement range: Electricity Resistance:1×10-6~1×10-1Ω , Resolution:1×10-7Ω Electrical resistivity:1×10-7~1×10-2Ω-mm, Resolution:1×10-8 3、 Material size:200mm*5mm*1mm,500mm*5mm*1mm,1000mm*5mm*1mm 4、 Four wire probe;0.5 mm-0.7mm 5Fixtures: Different fixtures can be designed for different samples 6Dimensions: Main machine1300mm(Long) ×800 mm(Width) ×500mm(High) 7Net Heavy: ≤60kg
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Bktem-t 1Thermoelectric Saibei coefficient tester |
Bktem-t 1Thermoelectric Saibei coefficient testerTo determine semiconductor materials, metal materials, and other thermoelectric materials(Bi2Te3, PbTe, Skutteruditeswait)ofSeebeckCoefficient and conductivity. Application scope:1Can measure semiconductor materials, metal materials, and other thermoelectric materials(Bi2Te3,PbTe,SkutteruditesCopper, nickel, tungsten and other metals,TeTheBi2Te3TheZrNiSnTheZnAgSbTheNiMoSbTheSnteTheFeNbSbTheCuGaTe2TheGeTeTheAg1-xCuSTheCu2ZnSnSe4wait)ofSeebeckCoefficient, conductivity, and resistivity. 3Both block and film materials can be tested. 4、Is the contact between the sample and the lead normalV-1The device can automatically detect. 5Having self analysis software, independent analysis, automatic process control, and user-friendly interface. 6Research in materials departments of domestic universities or production units of thermoelectric materials. 7、Automotive and fuel, energy efficiency, alternative energy sectors, thermoelectric refrigeration. Technical specifications requirements Temperature measurement: room temperature-600℃ Number of samples tested simultaneously: 1a Measurement function: Material Seebeck coefficient and resistivitySeebeckCoefficient and conductivity Temperature control accuracy: 0.5K Measurement principle: Seebeck coefficient: static direct current; Coefficient of Resistance: Four Terminal Method Measurement accuracy: Seebeck coefficient: < ±7%; Resistance coefficient: < ±10% sample size;Block shaped square bar:2-3×2-3 mm×10-23mmLong, thin film material: ≥50 nm Thermocouple lead distance: ≥6 mm electricity Flow;0 to 160 mA Heating electrode phase number/Voltage: single-phase,220V, |
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WLDR-1000Laser Thermal Conductivity Tester
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WLDR-1000The Type Laser Thermal Conductivity Tester is a product developed by the Institute of Physics, Chinese Academy of SciencespickIrradiate the sample with a laser beam and measure the increase in temperature on the back of the sample using an infrared detector,It is a fast non-contact instrument for measuring thermal conductivity.To calculate the thermal diffusion coefficient of the sample. It has the characteristics of being fast and convenient. The measured thermal diffusion coefficient is0.001...10cm2/sec,And the specific heat of the sample can be measured to further calculate the thermal conductivity.Laser thermal conductivity tester is suitable for testing the thermal conductivity of the vast majority of materials, except for insulation materials. Laser thermal conductivity meter is particularly suitable for testing the thermal conductivity of high thermal conductivity materials and at high temperatures. It is widely used in materials, automotive, aerospace, electronics, chemical, energy and other fields, and is currently an important scientific research equipment for production units and universities. 1The product complies with:GJB 1201.1-91Test method for high temperature thermal diffusivity of solid materials - Laser pulse method ASTMD 1461Determination of Thermal Diffusion Coefficient by Flash Method ASTM E2585Measuring thermal diffusivity using the flash method GBT 22588Flash method for measuring thermal diffusivity or thermal conductivity 2、 Main features: 1Eliminating interference signals at the outer edge of the sample can greatly improve the accuracy of measurement results. 2Data acquisition rate, extremely narrow light pulse width, allowing measurement of thin and highly thermally conductive materials 3Multiple mathematical model fitting, precise pulse width correction and pulse energy integration, heat loss correction, built-in database 4Can achieve two modes of vacuum measurement and protective atmosphere measurement 5Using an infrared detector for non-contact testing of sample surface temperature rise signals 6Multi layer contact thermal resistance analysis can be conducted, and parameters such as thermal resistance and thermal diffusion rate can be calculated. The specific heat can be calculated using a standard sample with known specific heat and through comparison method; 2、 Main technical performance 1Temperature range: room temperature~500℃,600℃,1000℃. (Customization is required for ultra-low temperatures) 2Scope of thermal conductivity testing:0.1~300W/mK, 1~500W/mK,10~1000W/mK; 3Range of thermal diffusion coefficient:0.01~1000mm2/s; 4TheCpRepeatability: ±3% (Most materials) 5Repeatability of thermal diffusion coefficient: ±2 (Most materials) 6Scope of sample testing: Square ≥10×10mm, Circle: φ12~20(Optional)20Special specifications, thickness0.1~10mmOptimal thickness:3mm) 7Pulse energy:15J/Next, the pulse energy and interval can be adjusted 8Sensor type:Insb/MCT,air cooling 9Signal detection method: Infrared detector is used for non-contact testing of sample surface temperature rise signals; 10Scope of sample testing: Square not less than10×10mm, circular diameter12~20(Optional)20Special specifications, thickness0.1~10mmTry to choose3mmThick samples; 11Test sample types: solid block, low viscosity liquid, high viscosity liquid, viscous semi-solid, elastic solid, film, etc. can all be adapted, and solid powder requires special customization; 12Test sample channel: single channel 13Atmosphere: It can achieve two modes of vacuum measurement and protective atmosphere measurement (atmosphere: inert, oxidizing, reducing, static, dynamic), and is equipped with standard ambient temperature and pressure air environment; 14Software function: It can perform multi-layer contact thermal resistance analysis and calculate parameters such as thermal resistance and thermal diffusion rate. Using a standard sample with known specific heat, the specific heat can be calculated through comparison method; 15Can be connected to a computer for fully automatic control, with a Chinese operating interface and automatic printing of test reports; 16Multiple mathematical model fitting, precise pulse width correction and pulse energy integration, heat loss correction, built-in database. 17Equipment size:120*110*125CM 18Weight:80KG
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