The scanning slit spot analyzer is mainly used to measure key parameters such as spot size, energy distribution, divergence angle, and M ² factor of laser beams, and is suitable for beam quality detection in fields such as laser processing and fiber optic communication.
The scanning slit spot analyzer can accurately obtain the contour, energy distribution, and key parameters (such as beam width, peak center, ellipticity, etc.) of the spot by moving the slit to scan the spot and measure the light intensity distribution. The following is a detailed analysis of its core features, application scenarios, and purchasing recommendations:
Main functions:
Small spot measurement capability: Scanning slit analyzers have significant advantages in measuring micrometer sized spots. The camera style cannot accurately capture small spot details due to pixel size limitations, while the scanning slit style can fully restore the spot morphology by scanning point by point.
High power testing stability: The camera style spot analyzer needs to reduce power through attenuation plates to avoid saturation, while the scanning slit type directly measures the light intensity at the slit without additional attenuation, simplifying the operation process and improving testing stability.
Complex spot processing capability: For non Gaussian distributions or spots with high-order transverse modes, the camera style can simultaneously receive and feedback the spot shape through a pixel array, while the scanning slit style accumulates optical power in the slit direction, resulting in loss of details. However, by optimizing the scanning strategy (such as multi-directional scanning), the scanning slit can still partially compensate for this deficiency.
Industrial manufacturing applications
Laser processing: Monitor the beam quality during laser cutting, welding, marking, and other processes to ensure processing accuracy and efficiency.
Optical component testing: Evaluate the manufacturing quality of components such as lenses and mirrors, and detect eccentricity and surface smoothness.
Application in scientific research field
Research on beam characteristics: Analyze the spatial and temporal characteristics of beams, evaluate the nonlinear effects and optical transmission attenuation of optical devices.
Microstructure observation: used for microstructure observation under optical microscopes and analysis of nanomaterials.