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Technical principle and application examples of X-ray absorption spectrometer
Date: 2025-06-17Read: 0
Technical Principle
The X-ray absorption spectrometer (XAS) is based on the interaction between X-rays and specific elements in matter. When X-rays pass through a sample, specific energy rays are absorbed by atoms in the sample, triggering electron transitions and emitting X-rays of specific wavelengths. These emitted X-rays carry information about the atomic structure and electronic state of the sample. The core of XAS technology is to finely regulate X-ray energy, excite electronic transitions of specific elements in the sample, and measure the energy and intensity of X-rays. By analyzing the shape, position, and intensity of absorption spectral lines, key information such as elemental valence states, coordination environments, chemical bond types, and local electronic structures can be obtained.
Application Examples
In the field of materials science, XAS technology can be used to study the crystal structure, electronic states, and elemental distribution of materials. For example, in the research of battery materials, XAFS technology can perform in-situ testing to analyze the changes in elemental valence states and structures of materials during battery charging and discharging processes, providing a basis for optimizing battery performance. In the field of chemistry, XAS technology can reveal chemical reaction mechanisms and help scientists understand the changes in atomic and electronic structures during the reaction process. The research team of One Carbon Chemical Engineering at Tianjin University used X-ray absorption fine structure spectrometer to characterize the electronic structure and coordination environment of CuxSi catalyst, providing new insights into the Cu-O-Si interface and reactions on Cu Si core-shell particle catalysts. In biology and medicine, XAS technology provides a new approach for studying the spatial conformation of biomolecules and for disease diagnosis and treatment. In addition, XAS technology can also be used for metal material composition detection, thin film material thickness measurement, non-destructive analysis of archaeological samples, and other scenarios.